Environmental scanning electron microscopy (ESEM) with X-ray microanalysis
Description
The Quanta 600 Environmental Scanning Electron Microscope (ESEM) from FEI enables high-resolution imaging (3 nm) and analysis of materials at the micro and nanometer scale. It allows for the study of both conductive and non-conductive specimens under various pressure conditions (10⁻⁵ to 26 mbar) and temperatures (-20 °C to 1500 °C). ESEM provides morphological and topographical observations, energy dispersive X-ray spectroscopy (EDX) for elemental composition analysis, and dynamic experiments including humidity and temperature cycles, making it versatile for various applications in materials science, biomedical research, and quality control.
General info
Terms and Conditions:
Academic collaboration on site
Ownership:
100% owned by university
Contacts
Contact person:
Mariana Stefanova Stankova
Contact person position:
Responsible
Contact person e-mail:
mariana.stefanova@urv.cat
Contact person phone:
977558123
Support staff name:
Mercè Moncusí Mercadé
Support staff position:
Responsible
Support staff e-mail:
merce.moncusi@urv.cat
Support staff phone:
977558123
