Environmental scanning electron microscopy (ESEM) with X-ray microanalysis

The Quanta 600 Environmental Scanning Electron Microscope (ESEM) from FEI enables high-resolution imaging (3 nm) and analysis of materials at the micro and nanometer scale. It allows for the study of both conductive and non-conductive specimens under various pressure conditions (10⁻⁵ to 26 mbar) and temperatures (-20 °C to 1500 °C). ESEM provides morphological and topographical observations, energy dispersive X-ray spectroscopy (EDX) for elemental composition analysis, and dynamic experiments including humidity and temperature cycles, making it versatile for various applications in materials science, biomedical research, and quality control.