Transmission electron microscopy (TEM)
Description
Transmission Electron Microscopy (TEM) is a technique that uses an electron beam to study the morphology, crystallinity, and chemical composition of materials at the micro and nanoscale. It provides high-resolution images (0.2 nm) and allows detailed analysis of biological and nanostructured materials, such as proteins, nanoparticles, and thin films.
General info
Affiliation:
Scientific & Technical Resources Service
Keywords:
Terms and Conditions:
Academic collaboration on site
Ownership:
100% owned by university
Contacts
Contact person:
Rita Marimon Picó
Contact person position:
Responsible
Contact person e-mail:
rita.marimon@urv.cat
Contact person phone:
977558473
Support staff name:
Mercè Moncusí Mercadé
Support staff position:
Responsible
Support staff e-mail:
merce.moncusi@urv.cat
Support staff phone:
977558123
