X-ray Photoelectron Spectroscopy (XPS)

X-ray Photoelectron Spectroscopy (XPS) is a powerful, non-destructive analytical technique that provides detailed information about the chemical and electronic properties of elements present in the surface layers of materials (20-30 Å). By analyzing the kinetic energies of photoelectrons emitted upon X-ray excitation, XPS allows for the identification and quantification of elements, as well as insights into their oxidation states and chemical environments. The ProvenX-NAP System enhances traditional XPS capabilities by enabling analysis under Near Ambient Pressure (NAP) conditions, facilitating the study of surfaces in more realistic environments.