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X-Ray diffraction


Description

X-ray diffraction (XRD) is a non-destructive analytical technique used to identify and quantify the crystalline phases in solid materials. By analyzing the diffractograms produced when X-rays interact with crystalline structures, researchers can derive critical information about the material’s structure, composition, and properties. The Bruker D8-DISCOVER and D8-ADVANCE systems enable advanced analyses, including temperature variations, residual stress measurements, and crystallinity assessments, making XRD essential in materials science, geology, and engineering.

General info



Specific research area:
1.4 Chemical Sciences, 1.5 Earth and Related Environmental Sciences, 1.6 Biological Sciences, 1.7 Other Natural Sciences, 2.2 Electrical/Electronic/Information Engineering, 2.4 Chemical Engineering, 2.5 Materials Engineering, 2.6 Medical Engineering, 2.7 Environmental Engineering, 2.8 Environmental Biotechnology, 2.9 Industrial Biotechnology, 2.10 Nano-Technology, 2.11 Other Engineering and Technologies, 3.3 Health Sciences, 3.4 Medical Biotechnology, 4.1 Agriculture, Forestry and Fisheries, 4.4 Agricultural Biotechnology, 5.1 Psychology and Cognitive Sciences, 6.1 History and Archeology, 6.4 Arts (arts, history of arts, performing arts, music)



Ownership:
100% owned by university

Contacts

Contact person:
Francesc Gispert i Guirado
Contact person position:
Responsible
Contact person e-mail:
drx.srcit@urv.cat
Contact person phone:
977559783
Support staff name:
Ramon Guerrero Grueso
Support staff position:
Responsible
Support staff e-mail:
rmn.srcit@urv.cat
Support staff phone:
977558149