Scanning Electron Microscope (SEM) – FEI Nova Nano FEG-SEM 450
Description
The FEI Nova NanoSEM scanning electron microscopes combine best-in-class imaging with superb analytical performance in one easy-to-use instrument combining very low kV imaging and analytical capabilities with unique low vacuum performance to meet your most demanding nanoscale characterization requirements. The microscope is equipped with TLD, EDT, BSE and LVD detectors.
General info
Research area:
Specific research area:
Keywords:
Contacts
Contact person:
Rocco Di Girolamo
Contact person position:
Associate Professor
Contact person e-mail:
rocco.digirolamo@unina.it
Via Vicinale Cupa Cintia Edificio
7
80126
Naples
Italy
Manage Cookie Consent
We use cookies to optimize our website and our service.
Functional Always active
The technical storage or access is strictly necessary for the legitimate purpose of enabling the use of a specific service explicitly requested by the subscriber or user, or for the sole purpose of carrying out the transmission of a communication over an electronic communications network.
Preferences
The technical storage or access is necessary for the legitimate purpose of storing preferences that are not requested by the subscriber or user.
Statistics
The technical storage or access that is used exclusively for statistical purposes.
The technical storage or access that is used exclusively for anonymous statistical purposes. Without a subpoena, voluntary compliance on the part of your Internet Service Provider, or additional records from a third party, information stored or retrieved for this purpose alone cannot usually be used to identify you.
Marketing
The technical storage or access is required to create user profiles to send advertising, or to track the user on a website or across several websites for similar marketing purposes.