Scanning Electron Microscope (SEM) – FEI Nova Nano FEG-SEM 450
Description
The FEI Nova NanoSEM scanning electron microscopes combine best-in-class imaging with superb analytical performance in one easy-to-use instrument combining very low kV imaging and analytical capabilities with unique low vacuum performance to meet your most demanding nanoscale characterization requirements. The microscope is equipped with TLD, EDT, BSE and LVD detectors.
General info
Research area:
Keywords:
Terms and Conditions:
Academic collaboration on site, Pay for use
Ownership:
100% owned by university
Contacts
Contact person:
Rocco Di Girolamo
Contact person position:
Associate Professor
Contact person e-mail:
rocco.digirolamo@unina.it
Via Vicinale Cupa Cintia Edificio
7
80126
Naples
Italy
