Scanning Electron Microscope (SEM) – FEI Nova Nano FEG-SEM 450

The FEI Nova NanoSEM scanning electron microscopes combine best-in-class imaging with superb analytical performance in one easy-to-use instrument combining very low kV imaging and analytical capabilities with unique low vacuum performance to meet your most demanding nanoscale characterization requirements. The microscope is equipped with TLD, EDT, BSE and LVD detectors.