High-resolution scanning electron microscope (FESEM-FIB)

Description

The Scios 2 High-Resolution Scanning Electron Microscope (FESEM-FIB) by FEI is a cutting-edge instrument that integrates a focused ion beam (FIB) and an electron beam to produce ultra-high resolution images and facilitate precise sample preparation for transmission electron microscopy. It features advanced detectors for compositional and material contrast, enabling in-depth morphological and chemical analysis of various materials, including magnetic and insulating specimens. With capabilities for 3D characterization and nanostructure fabrication, the Scios 2 is a versatile tool for nanotechnology research and material science applications.

General info

Type:

infrastructure

Research area:

1. Natural Sciences, 2. Engineering and Technology, 3. Medical and Health Sciences, 4. Agricultural and Veterinary Sciences, 5. Social Sciences, 6. Humanities,

Specific research area:

1.4 Chemical Sciences, 1.5 Earth and Related Environmental Sciences, 1.6 Biological Sciences, 1.7 Other Natural Sciences, 2.2 Electrical/Electronic/Information Engineering, 2.4 Chemical Engineering, 2.5 Materials Engineering, 2.6 Medical Engineering, 2.7 Environmental Engineering, 2.8 Environmental Biotechnology, 2.9 Industrial Biotechnology, 2.10 Nano-Technology, 2.11 Other Engineering and Technologies, 3.3 Health Sciences, 3.4 Medical Biotechnology, 4.1 Agriculture, Forestry and Fisheries, 4.4 Agricultural Biotechnology, 5.1 Psychology and Cognitive Sciences, 6.1 History and Archeology, 6.4 Arts (arts, history of arts, performing arts, music)

University:

Universitat Rovira i Virgili

Keywords:

FESEM, FIB, ultra-high resolution, nanostructure fabrication, 3D characterization,

Website:

Link here

Ownership:

100% owned by university