Atomic force microscopy (AFM)

Description

The Agilent 5500 Atomic Force Microscope (AFM) is a versatile tool for creating three-dimensional topographic maps of materials at nanometric and atomic resolutions. It operates in both contact and tapping modes, allowing for comprehensive surface characterization of a wide range of materials, including insulators, conductors, and biological samples. The AFM can also perform various measurements such as electrical conductivity, magnetic domain mapping, and nanohardness, making it essential for research in materials science, biology, and nanotechnology.

General info

Type:

infrastructure

Research area:

1. Natural Sciences, 2. Engineering and Technology, 3. Medical and Health Sciences, 4. Agricultural and Veterinary Sciences, 5. Social Sciences, 6. Humanities,

Specific research area:

1.4 Chemical Sciences, 1.5 Earth and Related Environmental Sciences, 1.6 Biological Sciences, 1.7 Other Natural Sciences, 2.2 Electrical/Electronic/Information Engineering, 2.4 Chemical Engineering, 2.5 Materials Engineering, 2.6 Medical Engineering, 2.7 Environmental Engineering, 2.8 Environmental Biotechnology, 2.9 Industrial Biotechnology, 2.10 Nano-Technology, 2.11 Other Engineering and Technologies, 3.3 Health Sciences, 3.4 Medical Biotechnology, 4.1 Agriculture, Forestry and Fisheries, 4.4 Agricultural Biotechnology, 5.1 Psychology and Cognitive Sciences, 6.1 History and Archeology, 6.4 Arts (arts, history of arts, performing arts, music)

University:

Universitat Rovira i Virgili

Keywords:

Atomic Force Microscopy, topography measurement, nanotechnology, conductivity measurements, surface characterization,

Website:

Link here

Ownership:

100% owned by university