Atomic force microscopy (AFM)
Description
The Agilent 5500 Atomic Force Microscope (AFM) is a versatile tool for creating three-dimensional topographic maps of materials at nanometric and atomic resolutions. It operates in both contact and tapping modes, allowing for comprehensive surface characterization of a wide range of materials, including insulators, conductors, and biological samples. The AFM can also perform various measurements such as electrical conductivity, magnetic domain mapping, and nanohardness, making it essential for research in materials science, biology, and nanotechnology.
General info
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Contacts
Contact person:
Mariana Stefanova Stankova
Contact person position:
Responsible
Contact person e-mail:
mariana.stefanova@urv.cat
Contact person phone:
977558123
Support staff name:
Eric Pedrol Ripoll
Support staff position:
Responsible
Support staff e-mail:
eric.pedrol@urv.cat
Support staff phone:
977558473
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