X-Ray diffraction
Description
X-ray diffraction (XRD) is a non-destructive analytical technique used to identify and quantify the crystalline phases in solid materials. By analyzing the diffractograms produced when X-rays interact with crystalline structures, researchers can derive critical information about the material’s structure, composition, and properties. The Bruker D8-DISCOVER and D8-ADVANCE systems enable advanced analyses, including temperature variations, residual stress measurements, and crystallinity assessments, making XRD essential in materials science, geology, and engineering.
General info
Specific research area:
Ownership:
100% owned by university
Contacts
Contact person:
Francesc Gispert i Guirado
Contact person position:
Responsible
Contact person e-mail:
drx.srcit@urv.cat
Contact person phone:
977559783
Support staff name:
Ramon Guerrero Grueso
Support staff position:
Responsible
Support staff e-mail:
rmn.srcit@urv.cat
Support staff phone:
977558149