Small Angle X-Ray Scattering
Description
Small angle X-ray scattering is powerful tool for characterization of particle`s size in nanoparticulate systems. It can be used for measurement of the systems containing particles with sizes up to 100 nm.
General info
Research area:
Keywords:
ERC keywords:
PE31 Structure of solids,PE4 Physical and Analytical Chemical Sciences
Terms and Conditions:
Commercial collaboration, Pay for use
Ownership:
100% owned by university
Contacts
Contact person:
Petr Suchomel
Contact person position:
Business Development Manager
Contact person e-mail:
petr.suchomel@upol.cz
Contact person phone:
+420 739 329 981
Slechtitelu
21
783 71
Olomouc
Czech Republic
