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High-resolution scanning electron microscope (FESEM-FIB)


Description

The Scios 2 High-Resolution Scanning Electron Microscope (FESEM-FIB) by FEI is a cutting-edge instrument that integrates a focused ion beam (FIB) and an electron beam to produce ultra-high resolution images and facilitate precise sample preparation for transmission electron microscopy. It features advanced detectors for compositional and material contrast, enabling in-depth morphological and chemical analysis of various materials, including magnetic and insulating specimens. With capabilities for 3D characterization and nanostructure fabrication, the Scios 2 is a versatile tool for nanotechnology research and material science applications.

General info


Research area:
1, 2, 3, 4, 5, 6,


Keywords:
F, F, u, n, 3,


Ownership:
100% owned by university

Contacts

Contact person:
Mariana Stefanova Stankova
Contact person position:
Responsible
Contact person e-mail:
mariana.stefanova@urv.cat
Contact person phone:
977558123
Support staff name:
Rita Marimon Picó
Support staff position:
Responsible
Support staff e-mail:
rita.marimon@urv.cat
Support staff phone:
977558473